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研究人才詳細資料


出版年月 著作類別 著作名稱 作者 收錄出處
2019-01 期刊論文 An Improved Manufacturing Yield Measure for Gold Bumping Processes with Very Low Nonconformities Wu, C. H., Pearn, W. L., and Tai, Y. T. IEEE Transactions on Components, Packaging and Manufacturing Technology
2018-12 期刊論文 An Analytical Closed Form Solution for Multiple Line Supplier Selection Problem Pearn, W. L., Tai, Y. T., and Tseng, S. C. Quality Technology & Quantitative Management
2018-12 期刊論文 Power Analysis for Group Supplier Selection with Multiple Production Lines Pearn, W. L., Tai, Y. T., Wu, Y. W., and Wang, Y. A. Quality and Reliability Engineering International
2018-01 期刊論文 Production Yield for Multiple Line Processes: Product Acceptance Determination Pearn, W. L., Tai, Y. T., and Chiu, Y. T. Journal of Testing and Evaluation
2017-02 期刊論文 Lower confidence bounds as precision measure for truncated processes Wu, C. H., Pearn, W. L., and Tai, Y. T., and Lin, P. C. Communications in Statistics - Simulation and Computation
2016-12 期刊論文 A note on production yield measure for multiple lines Pearn, W. L., Tai, Y. T. and Wu, C. H. Quality Technology & Quantitative Management
2016-10 期刊論文 Group Supplier Selection for Multiple-Line Gold Bumping Processes Pearn, W. L. and Tai, Y. T. IEEE Transactions on Components, Packaging and Manufacturing Technology
2016-09 期刊論文 Estimation of a modified capability index for non-normal distributions Pearn, W. L., Tai, Y. T., and Wang, H. T. Journal of Testing and Evaluation
2016-02 期刊論文 The construction of mobile business application system for SAP ERP Tai, Y. T., Huang, C. H. and Chuang, S. C. Kybernetes
2015-11 期刊論文 Manufacturing yield for multiple lines gold bumping processes with asymmetric tolerances Tai, Y. T. IEEE Transactions on Semiconductor Manufacturing
2015-08 期刊論文 Measuring the manufacturing yield for skewed wire bonding processes Tai, Y. T. and Pearn, W. L. IEEE Transactions on Semiconductor Manufacturing
2015-07 期刊論文 Convenient ratio approach for industrial implementation in estimating and testing process yield Pearn, W. L., Tai, Y. T., and Kao, C. M. Journal of Testing and Evaluation
2015-07 研討會論文 Process yield index and asymmetric tolerances Tai, Y. T., Lee, L. C. and Lin, C. Y
2015-02 期刊論文 Product mix determination and capacity allocation for heterogeneous products in thin film transistor liquid crystal display manufacturing Tai, Y. T., Pearn, W. L., and Chen, C. C. Computers & Industrial Engineering
2014-11 期刊論文 Approximately unbiased estimator for non-normal process capability index Pearn, W. L., Tai, Y. T., Hsiao, I. F., and Ao, Y. P. Journal of Testing and Evaluation
2014-07 研討會論文 Process yield assessment for processes with multiple manufacturing lines Tai, Y. T. and Wang, H. C.
2014-05 期刊論文 Capability assessment for Weibull in-cell touch panel manufacturing processes with variance change Tai, Y. T., Pearn, W. L., Huang, K. B., and Liao, L. W. IEEE Transactions on Semiconductor Manufacturing
2013-11 期刊論文 Analytic solution to product acceptance determination for gold bumping process with multiple manufacturing lines Pearn, W. L., Tai, Y. T., Wu, C. H., and Chuang, C. C. IEEE Transactions on Components, Packaging and Manufacturing Technology
2013-07 研討會論文 A mathematical model for sequential batching processing machines scheduling problem in TFT-LCD process Tai, Y. T., Huang, C. Y., and Chen, S. H.
2013-03 期刊論文 The burn-in test scheduling problem with batch dependent processing time and sequence dependent setup time Pearn, W. L., Hong, J. S., and Tai, Y. T. International Journal of Production Research
2013-02 研討會論文 An evolutionary algorithm for semiconductor batch processing machine scheduling problem Tai, Y. T.
2012-07 期刊論文 An effective powerful test for supplier selection evaluation with multiple characteristics Pearn, W. L., Tai, Y. T., and Wang, C. Y. Journal of Testing and Evaluation
2012-07 研討會論文 Supplier selection based on process yield for LED manufacturing processes Tai, Y. T. and Wu, C. W.
2012-05 期刊論文 Evaluating process yield for LED assembly under undetected process parameter change Tai, Y. T. Journal of Testing and Evaluation
2012-05 期刊論文 Measuring the manufacturing yield for processes with multiple manufacturing lines Tai, Y. T., Pearn, W. L., and Kao, C. M. IEEE Transactions on Semiconductor Manufacturing
2012-01 期刊論文 Cycle time estimation for semiconductor final testing processes with weibull-distributed waiting time Tai, Y. T., Pearn, W. L., and Lee, J. H. International Journal of Production Research
2011-12 期刊論文 Capability assessment for processes with multiple characteristics: a generalization of the popular index Cpk Pearn, W. L., Shiau, J. -J. H., Tai, Y. T., and Li, M. Y. Quality and Reliability Engineering International
2011-11 期刊論文 An effective test for supplier selection evaluation with multiple characteristics Tai, Y. T., Pearn, W. L., and You, S. K. Journal of Testing and Evaluation
2011-09 期刊論文 Process capability evaluation for square bumps with mean shift Pearn, W. L., Hung, H. N., Tai, Y. T., and Hou, H. H. Journal of Testing and Evaluation
2011-08 期刊論文 Accessing manufacturing yield for gamma wafer sawing processes in COG packaging Pearn, W. L., Tai, Y. T., Huang, K. B., and Ku, P. L. IEEE Transactions on Components, Packaging and Manufacturing Technology
2011-08 研討會論文 Evaluating process capability under undetected fluctuations Tai, Y. T.
2011-01 期刊論文 The liquid crystal injection scheduling problem (LCISP) Tai, Y. T. and Lai, C. M. International Journal of Production Research
2010-07 研討會論文 Evolutionary computing for the liquid crystal display module scheduling problem in a TFT LCD factory Tai, Y. T.
2010-04 期刊論文 Measuring Manufacturing Yield for Gold Bumping Processes under Dynamic Variance Change Pearn, W. L., Tai, Y. T., and Chiang, W. L. IEEE Transactions on Electronics Packaging Manufacturing
2009-12 期刊論文 Minimizing makespan on parallel batch processing machines with non-identical ready time and arbitrary job sizes Chung, S. H., Tai, Y. T. and Pearn, W. L. International Journal of Production Research
2009-07 期刊論文 An Effective Scheduling Approach for Maximizing Polyimide Weighted Printing Throughput in Cell Assembly Factories Chung, S. H., Tai, Y. T. and Pearn, W. L. IEEE Transactions on Electronics Packaging Manufacturing
2009-07 期刊論文 Statistical Approach for Cycle Time Estimation in Semiconductor Packaging Factories Pearn, W. L., Tai, Y. T., and Lee, J. H. IEEE Transactions on Electronics Packaging Manufacturing
2009-05 期刊論文 Fast and Effective Algorithms for the Liquid Crystal Display Module (LCM) Scheduling Problem with Sequence Dependent Setup Time Chung, S. H., Pearn, W. L. and Tai, Y. T. Journal of the Operational Research Society
2008- 研討會論文 The design of outsourcing planning for semiconductor backend turnkey service Chung, S. H., Chung, I. P., Tai, Y. T. and Chu, Y. M.